Characterisation of MFM tip fields by electron tomography

Ferrier, R.P., McVitie, S. , Gallagher, A. and Nicholson, W.A.P. (1997) Characterisation of MFM tip fields by electron tomography. IEEE Transactions on Magnetics, 33(5), pp. 4062-4064. (doi: 10.1109/20.619663)

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Lorentz electron microscopy has been applied to the study of the magnetic field distribution from MFM tips. Data acquired by this technique has been used to reconstruct the field distribution from the MFM tip by tomography. Initial results have been obtained from commercial tips which have been magnetised along the tip axis. The reconstructed field is consistent with the predicted form.

Item Type:Articles
Glasgow Author(s) Enlighten ID:McVitie, Professor Stephen
Authors: Ferrier, R.P., McVitie, S., Gallagher, A., and Nicholson, W.A.P.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:IEEE Transactions on Magnetics

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