Multistatic Radar: System Requirements and Experimental Validation

Inggs, M., Griffiths, H., Fioranelli, F. , Ritchie, M. and Woodbridge, K. (2014) Multistatic Radar: System Requirements and Experimental Validation. In: 2014 International Radar Conference (Radar), Lille, 13-17 Oct 2014, pp. 1-6. ISBN 9781479941957 (doi:10.1109/RADAR.2014.7060435)

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Abstract

Multistatic radar provides many advantages over conventional monostatic radar, such as enhanced information on target signatures and improvements in detection which are due to the multiple perspectives and differences in the properties of clutter. Furthermore, the fact that receive-only multistatic nodes are passive may be an advantage in military applications. In order to quantify potential performance benefits of these advantages a comprehensive understanding of target and clutter behaviour in multistatic scenarios is necessary. However, such information is currently limited because bistatic and multistatic measurements are difficult to make, their results depend on many variables such as multistatic geometry, frequency, polarization, and many others, and results from previous measurements are likely to be classified for military targets. Multistatic measurements of targets and clutter have been performed over the past few years by the NetRAD system developed at the University College London and the University of Cape Town. A new system, NeXtRAD, is now being developed in order to investigate some of the many aspects of multistatic radar. This paper discusses the results obtained with the previous system and the lessons learnt from its use. These points are then discussed in the context of the new radar, defining key important factors that have to be considered when developing a new multistatic radar system.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Fioranelli, Dr Francesco
Authors: Inggs, M., Griffiths, H., Fioranelli, F., Ritchie, M., and Woodbridge, K.
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
ISBN:9781479941957

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