Moran, D. A. J., Fox, O. J. L., McLelland, H., Russell, S. and May, P. W. (2011) Inspection of Intrinsic Operation and DC Performance of 50nm Gate Length Hydrogen-Terminated Diamond Field Effect Transistors Using an Optimised Fabrication Process. In: SBDD XVI Diamond Workshop, Hasselt, Belgium, Feb 2011,
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Abstract
No abstract available.
Item Type: | Conference Proceedings |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Russell, Dr Stephen and McLelland, Mrs Helen |
Authors: | Moran, D. A. J., Fox, O. J. L., McLelland, H., Russell, S., and May, P. W. |
College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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