PXAMS — projectile X-ray AMS: X-ray yields and applications

McAninch, J.E., Bench, G.S., Freeman, S.P.H.T. , Roberts, M.L., Southon, J.R., Vogel, J.S. and Proctor, I.D. (1995) PXAMS — projectile X-ray AMS: X-ray yields and applications. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 99(1-4), pp. 541-545. (doi:10.1016/0168-583X(94)00633-4)

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Abstract

Characteristic X-rays have recently been explored as a method for the detection and identification of ions in accelerator mass spectrometry (AMS) [H. Artigalas et al., Nucl. Instr. and Meth. B 92 (1994) 227; M. Wagner et al., Nucl. Instr. and Meth. B 89 (1994) 266]. After analysis in the AMS spectrometer, the ions stop in an appropriately chosen target and the induced X-rays identify the ions by atomic number. For the application of AMS to higher mass isotopes, characteristic X-rays allow significantly better discrimination of competing atomic isobars than is possible using energy loss detectors. Characteristic X-rays also show promise as a convenient component in hybrid detection systems. Measurements of X-ray yields are presented for Si, Fe, Ni, Se, Mo, and Pd ions of 0.5 – 2 MeV/amu. The yields rise by more than a factor of 10 over this energy range, and approach 1 X-ray per incident ion at 2 MeV/amu for the lighter ions. Preliminary work on the application of PXAMS to the detection of 79Se is described.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Freeman, Professor Stewart
Authors: McAninch, J.E., Bench, G.S., Freeman, S.P.H.T., Roberts, M.L., Southon, J.R., Vogel, J.S., and Proctor, I.D.
College/School:College of Science and Engineering > Scottish Universities Environmental Research Centre
Journal Name:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Publisher:Elsevier
ISSN:0168-583X
ISSN (Online):1872-9584

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