Microbeam PIXE analysis using wavelength dispersive spectrometry

Morse, D.H., Bench, G.S., Freeman, S.P.H.T. and Pontau, A.E. (1995) Microbeam PIXE analysis using wavelength dispersive spectrometry. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 99(1-4), pp. 427-430. (doi:10.1016/0168-583X(94)00636-9)

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Abstract

Wavelength dispersive X-ray spectrometry (WDS) offers significant advantages over energy dispersive X-ray spectrometry for PIXE analysis in some situations. Compared with energy dispersive Si(Li) detectors, the better energy resolution of WDS results in better separation of closely spaced adjacent X-ray peaks and enhanced signal to background ratios. These can result in greater accuracy in quantitative analysis, and increased sensitivity for trace element analysis. In addition, it is possible to analyze elements from beryllium upwards (Z ≥ 4). We have installed a commercial WDS detector on a nuclear microprobe system located at Lawrence Livermore National Laboratory. Advantages and limitations of wavelength dispersive spectrometry and considerations for calibration and operation are discussed. Representative results are presented for micro-PIXE analysis.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Freeman, Professor Stewart
Authors: Morse, D.H., Bench, G.S., Freeman, S.P.H.T., and Pontau, A.E.
College/School:College of Science and Engineering > Scottish Universities Environmental Research Centre
Journal Name:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Publisher:Elsevier
ISSN:0168-583X
ISSN (Online):1872-9584

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