McCarthy, A., Ren, X., Della Frera, A., Gemmell, N. R., Krichel, N. J., Scarcella, C., Ruggeri, A., Tosi, A. and Buller, G. S. (2013) Kilometer-range depth imaging at 1550 nm wavelength using an InGaAs/InP single-photon avalanche diode detector. Optics Express, 21(19), pp. 22098-22113. (doi: 10.1364/OE.21.022098) (PMID:24104102)
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Abstract
We have used an InGaAs/InP single-photon avalanche diode detector module in conjunction with a time-of-flight depth imager operating at a wavelength of 1550 nm, to acquire centimeter resolution depth images of low signature objects at stand-off distances of up to one kilometer. The scenes of interest were scanned by the transceiver system using pulsed laser illumination with an average optical power of less than 600 µW and per-pixel acquisition times of between 0.5 ms and 20 ms. The fiber-pigtailed InGaAs/InP detector was Peltier-cooled and operated at a temperature of 230 K. This detector was used in electrically gated mode with a single-photon detection efficiency of about 26% at a dark count rate of 16 kilocounts per second. The system’s overall instrumental temporal response was 144 ps full width at half maximum. Measurements made in daylight on a number of target types at ranges of 325 m, 910 m, and 4.5 km are presented, along with an analysis of the depth resolution achieved.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Gemmell, Mr Nathan |
| Authors: | McCarthy, A., Ren, X., Della Frera, A., Gemmell, N. R., Krichel, N. J., Scarcella, C., Ruggeri, A., Tosi, A., and Buller, G. S. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | Optics Express |
| Publisher: | Optical Society of America |
| ISSN: | 1094-4087 |
| ISSN (Online): | 1094-4087 |
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