Characterization of the Metal-Semiconductor Interface for Silicon Carbide Based Sensors

Woodworth, A. A., Peng, C. Y.,, Stinespring, C. D. and Meehan, K. (2004) Characterization of the Metal-Semiconductor Interface for Silicon Carbide Based Sensors. In: NATO-ASI Conference, Bulgaria, 6-17 Sept 2004,

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Abstract

No abstract available.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Meehan, Professor Kathleen
Authors: Woodworth, A. A., Peng, C. Y.,, Stinespring, C. D., and Meehan, K.
College/School:College of Science and Engineering

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