Merging Pedagogical Approaches: University of Glasgow-UESTC Joint Education Programme in Electronics and Electrical Engineering

Meehan, K., Davies, J. H. , Roy, S., Marsh, J. H. , Li, Y. , Gao, S., Zhou, D., Zhao, Z., Liu, X. and Luo, F. (2014) Merging Pedagogical Approaches: University of Glasgow-UESTC Joint Education Programme in Electronics and Electrical Engineering. In: 2014 IEEE Frontiers in Education Conference, Madrid, Spain, 22-25 Oct. 2014, pp. 1-5. (doi: 10.1109/fie.2014.7044387)

Abstract

The University of Glasgow-University of Electronic Science and Technology of China joint education programme enrolled its first cohort of students in Fall 2013. Continual assessment of the programme was initiated shortly thereafter to monitor student achievement in the programme, to evaluate how well the aims of the programme are being met, and to determine areas where improvements can be made. Several issueswere identified during the review as well as in informal conversations with course instructors, administrative support staff, and students. To quantify the impact of these issues, a study to examine the cultural attitudes, English language communication aptitude, problem-solving skills, learning style, and teacher-student relationship of the first cohort during their first year in its undergraduate programme in electronics and electrical engineering has been proposed The study will adopt an interpretive approach, using a longitudinal multivariate study design, to generate quantified descriptions of how each issue influences student behavior and success in the programme. A follow-on study on the course instructors' cultural attitudes, pedagogical approaches, and willingness to adapt is planned. The initial findings from the programme assessment and the proposed studies will be presented at the 2014 Frontiers in Education Conference in Madrid, Spain in October 2014.

• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Marsh, Professor John and Meehan, Professor Kathleen and Davies, Professor John and Li, Professor Yun and Roy, Professor Scott
• Authors: Meehan, K., Davies, J. H., Roy, S., Marsh, J. H., Li, Y., Gao, S., Zhou, D., Zhao, Z., Liu, X., and Luo, F.
• College/School: College of Science and Engineering; College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• ISSN: 9781479939220