Characterization of the metal-semiconductor interface for silicon carbide based sensor

Woodworth, A. A., Peng, C. Y., Stinespring, C. D. and Meehan, K. (2005) Characterization of the metal-semiconductor interface for silicon carbide based sensor. In: Vaseashta, A. K., Dimova-Malinovska, D. and Marshall, J.M. (eds.) Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology. Series: NATO science series II: mathematics, physics and chemistry (204). Springer Netherlands, pp. 387-390. ISBN 9781402035609 (doi: 10.1007/1-4020-3562-4_41)

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Abstract

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Item Type:Book Sections
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Meehan, Professor Kathleen
Authors: Woodworth, A. A., Peng, C. Y., Stinespring, C. D., and Meehan, K.
College/School:College of Science and Engineering
Journal Name:NATO Science Series II: Mathematics, Physics and Chemistry
Publisher:Springer Netherlands
ISSN:1568-2609
ISBN:9781402035609

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