Magnetic characteristics of a high-layer-number NiFe/FeMn multilayer

Paterson, G.W. , Goncalves, F.J.T., McFadzean, S., O'Reilly, S., Bowman, R. and Stamps, R.L. (2015) Magnetic characteristics of a high-layer-number NiFe/FeMn multilayer. Journal of Applied Physics, 118(20), 203903. (doi: 10.1063/1.4936199)

[img]
Preview
Text
112760.pdf - Accepted Version

1MB

Abstract

We report the static and dynamic magnetic characteristics of a high-layer-number NiFe/FeMn multilayer test structure with potential applications in broadband absorber and filter devices. To allow fine control over the absorption linewidths and to understand the mechanisms governing the resonances in a tailored structure similar to that expected to be used in real world applications, the multilayer was intentionally designed to have layer thickness and interface roughness variations. Magnetometry measurements show that the sample has complex hysteresis loops with features consistent with single ferromagnetic film reversals. Characterisation by transmission electron microscopy allows us to correlate the magnetic properties with structural features, including the film widths and interface roughnesses. Analysis of resonance frequencies from broadband ferromagnetic resonance measurements as a function of field magnitude and orientation provide values of the local exchange bias, rotatable anisotropy, and uniaxial anisotropy fields for specific layers in the stack and explain the observed mode softening. The linewidths of the multilayer are adjustable around the bias field, approaching twice that seen at larger fields, allowing control over the bandwidth of devices formed from the structure.

Item Type:Articles (Other)
Keywords:Magnetic anisotropy Multilayers Magnetic films Interface roughness Magnetic resonance Ferromagnetic resonance FMR Scanning transmission electron microscopy STEM Vibrating sample magnetometry VSM
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Stamps, Professor Robert and Paterson, Dr Gary and McFadzean, Dr Sam
Authors: Paterson, G.W., Goncalves, F.J.T., McFadzean, S., O'Reilly, S., Bowman, R., and Stamps, R.L.
Subjects:Q Science > QC Physics
College/School:College of Science and Engineering > School of Physics and Astronomy
Research Group:Materials and Condensed Matter Physics
Journal Name:Journal of Applied Physics
Journal Abbr.:JAP
Publisher:American Institute of Physics
ISSN:0021-8979
ISSN (Online):1089-7550
Copyright Holders:Copyright © 2015 American Institute of Physics
First Published:First published in Journal of Applied Physics 118(20):203903
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher

University Staff: Request a correction | Enlighten Editors: Update this record