Non-Contact Measurement of POA Irradiance and Cell Temperature for PV Systems

Lim, L. H. I. , Ye, Z. and Yang, D. (2015) Non-Contact Measurement of POA Irradiance and Cell Temperature for PV Systems. In: 41st Annual Conference of the IEEE Industrial Electronics Society (IECON2015), Yokohama, Japan, 09-12 Nov 2015, ISBN 9781479917624 (doi: 10.1109/IECON.2015.7392130)

Abstract

This paper presents a non-contact measurement of irradiance on plane of array (POA) and cell temperature for PV systems. The idea is motivated from the diode model of PV, where POA irradiance and cell temperature are proportional to the photocurrent and modified ideality factor, respectively. Based on the recent progress of diode model identification, the photocurrent and modified ideality factor can be linearly determined from I-V characteristics, which makes it feasible to develop a non-contact measurement approach for POA irradiance and cell temperature, i.e., both of them will be derived completely from the diode mode parameter identification without the need of any sensors. The calibration of the proportional factors is done from the indoor module flash test and then applied to outdoor module testbed to show the accuracy and effectiveness of the proposed method.

• Item Type: Conference Proceedings
• Additional Information: © 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Lim, Dr Li Hong Idris
• Authors: Lim, L. H. I., Ye, Z., and Yang, D.
• College/School: College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
• ISBN: 9781479917624
• Published Online: 28 January 2016
• Copyright Holders: Copyright © 2015 IEEE
• First Published: First published in 41st Annual Conference of the IEEE Industrial Electronics Society (IECON2015)
• Publisher Policy: Reproduced in accordance with the publisher copyright policy