High resolution quantitative Lorentz microscopy

McVitie, S. , McGrouther, D. and Krajnak, M. (2015) High resolution quantitative Lorentz microscopy. Journal of Physics: Conference Series, 644(1), 012026. (doi:10.1088/1742-6596/644/1/012026)

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Abstract

The advent of aberration corrected transmission electron microscopy has led to considerable improvements in the field of high resolution electron microscopy imaging. In this paper we show how these developments are applied to imaging of magnetic structure in field free or low field conditions. Whilst the capability of increased spatial resolution is demonstrated on magnetic layers with a width of *lt; 20nm we also consider how a pixelated detector can be used to dramatically increase the efficiency of the detection of the magnetic signal variation in the presence of strong diffraction contrast.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:McGrouther, Dr Damien and McVitie, Professor Stephen
Authors: McVitie, S., McGrouther, D., and Krajnak, M.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Journal of Physics: Conference Series
Publisher:Institute of Physics Publishing Ltd.
ISSN:1742-6588
ISSN (Online):1742-6596
Copyright Holders:Copyright © 2015 IOP Publishing
First Published:First published in Journal of Physics: Conference Series 644(1):012026
Publisher Policy:Reproduced under a Creative Commons License
Data DOI:10.5525/gla.researchdata.204

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Project CodeAward NoProject NamePrincipal InvestigatorFunder's NameFunder RefLead Dept
547981Current-Driven Domain Wall Motion in Multilayer NanowiresStephen McvitieEngineering & Physical Sciences Research Council (EPSRC)EP/I013520/1P&A - PHYSICS & ASTRONOMY