Linear chemically sensitive electron tomography using DualEELS and compressed sensing

Al-Afeef, A., Cockshott, W.P., Barges, P., Zuazo, I., Bobynko, J., Craven, A.J. and MacLaren, I. (2015) Linear chemically sensitive electron tomography using DualEELS and compressed sensing. In: Microscopy and Microanalysis MM2015, Portland, Oregon, 2-6 Aug 2015,

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Publisher's URL: http://www.microscopy.org/MandM/2015/

Abstract

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Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Al-Afeef, Mr Ala and Cockshott, Dr William and MacLaren, Dr Ian and Craven, Professor Alan
Authors: Al-Afeef, A., Cockshott, W.P., Barges, P., Zuazo, I., Bobynko, J., Craven, A.J., and MacLaren, I.
College/School:College of Science and Engineering > School of Computing Science
College of Science and Engineering > School of Physics and Astronomy
Copyright Holders:Copyright © 2015 The Authors
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