Goncalves, F. J. T., Desautels, R. D., Su, S., Drysdale, T., van Lierop, J., Lin, K.-W., Schmool, D. S. and Stamps, R. L. (2015) Anisotropy engineering using exchange bias on antidot templates. AIP Advances, 5(6), 067101. (doi: 10.1063/1.4922055)
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Abstract
We explore an emerging device concept based on exchange bias used in conjunction with an antidot geometry to fine tune ferromagnetic resonances. Planar cavity ferromagnetic resonance is used to study the microwave response of NiO/NiFe bilayers with antidot structuring. A large frequency asymmetry with respect to an applied magnetic field is found across a broad field range whose underlying cause is linked to the distribution of magnetic poles at the antidot surfaces. This distribution is found to be particularly sensitive to the effects of exchange bias, and robust in regards to the quality of the antidot geometry. The template based antidot geometry we study offers advantages for practical device construction, and we show that it is suitable for broadband absorption and filtering applications, allowing tunable anisotropies via interface engineering.
| Item Type: | Articles |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Stamps, Professor Robert and Drysdale, Dr Timothy |
| Authors: | Goncalves, F. J. T., Desautels, R. D., Su, S., Drysdale, T., van Lierop, J., Lin, K.-W., Schmool, D. S., and Stamps, R. L. |
| College/School: | College of Arts & Humanities > School of Critical Studies > English Literature College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
| Journal Name: | AIP Advances |
| Publisher: | American Institute of Physics |
| ISSN: | 2158-3226 |
| ISSN (Online): | 2158-3226 |
| Copyright Holders: | Copyright © 2015 The Authors |
| First Published: | First published in AIP Advances 5(6):067101 |
| Publisher Policy: | Reproduced under a Creative Commons License |
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