Zhang, T., Morgan, H., Curtis, A. and Riehle, M. (2001) Measuring particle-substrate distance with surface plasmon resonance microscopy. Journal of Optics A: Pure and Applied Optics, 3, pp. 333-337.
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Item Type: | Articles |
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Status: | Published |
Refereed: | Yes |
Glasgow Author(s) Enlighten ID: | Curtis, Professor Adam and Riehle, Dr Mathis |
Authors: | Zhang, T., Morgan, H., Curtis, A., and Riehle, M. |
College/School: | College of Medical Veterinary and Life Sciences > School of Molecular Biosciences |
Journal Name: | Journal of Optics A: Pure and Applied Optics |
ISSN: | 1464-4258 |
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