Measuring particle-substrate distance with surface plasmon resonance microscopy

Zhang, T., Morgan, H., Curtis, A. and Riehle, M. (2001) Measuring particle-substrate distance with surface plasmon resonance microscopy. Journal of Optics A: Pure and Applied Optics, 3, pp. 333-337.

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Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Curtis, Professor Adam and Riehle, Dr Mathis
Authors: Zhang, T., Morgan, H., Curtis, A., and Riehle, M.
College/School:College of Medical Veterinary and Life Sciences > Institute of Molecular Cell and Systems Biology
Journal Name:Journal of Optics A: Pure and Applied Optics
ISSN:1464-4258

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