Sensitivity map generation in electrical capacitance tomography using mixed normalization models

Kim, Y. S., Lee, S. H., Ijaz, U. Z. , Kim, K. Y. and Choi, B. Y. (2007) Sensitivity map generation in electrical capacitance tomography using mixed normalization models. Measurement Science and Technology, 18(7), pp. 2092-2102. (doi:10.1088/0957-0233/18/7/040)

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Abstract

This work is concerned with the generation of sensitivity maps in electrical capacitance tomography based on the concepts of electrical field centre lines. Electrical capacitance tomography systems are normalized at the upper and lower permittivity values for image reconstruction. Conventional normalization assumes the distribution of materials in parallel and results in normalized capacitance as a linear function of measured capacitance. A recent approach is the usage of a series sensor model which results in normalized capacitance as a nonlinear function of measured capacitance. In this study different forms of normalizations are combined with sensitivity maps based on electrical field centre lines and it is shown that a mix of two normalization models improves the reconstruction performance.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Ijaz, Dr Umer Zeeshan
Authors: Kim, Y. S., Lee, S. H., Ijaz, U. Z., Kim, K. Y., and Choi, B. Y.
College/School:College of Science and Engineering > School of Engineering > Infrastructure and Environment
Journal Name:Measurement Science and Technology
Publisher:Institute of Physics Publishing Ltd.
ISSN:0957-0233
ISSN (Online):1361-6501

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