Reliability Issues of Nanowires in FPNI Technology

Heidari, H., Mirzakuchaki, S. and Babaie, M. (2008) Reliability Issues of Nanowires in FPNI Technology. In: 16th Iranian Conference on Electrical Engineering (ICEE), Tehran, Iran, 13-15 May, 2008,

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Publisher's URL: http://ieee.org.ir/conference/icee-2008/

Abstract

No abstract available.

Item Type:Conference Proceedings
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Heidari, Dr Hadi
Authors: Heidari, H., Mirzakuchaki, S., and Babaie, M.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
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