Modeling of reliability for programmable nanowires interconnect

Heidari, H. , Mirzakuchaki, S. and Babaie, M. (2011) Modeling of reliability for programmable nanowires interconnect. International Proceedings of Computer Science and Information Technology, 6, pp. 288-292.

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Publisher's URL: http://www.ipcsit.com/list-30-1.html

Abstract

No abstract available.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Heidari, Dr Hadi
Authors: Heidari, H., Mirzakuchaki, S., and Babaie, M.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:International Proceedings of Computer Science and Information Technology
Journal Abbr.:IPCSIT
Publisher:IACSIT Press
ISSN:2010-460X
ISSN (Online):2010-460X

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