Modeling of reliability for programmable nanowires interconnect

Heidari, H., Mirzakuchaki, S. and Babaie, M. (2011) Modeling of reliability for programmable nanowires interconnect. International Proceedings of Computer Science and Information Technology, 6, pp. 288-292.

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Publisher's URL: http://www.ipcsit.com/list-30-1.html

Abstract

No abstract available.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:Heidari, Dr Hadi
Authors: Heidari, H., Mirzakuchaki, S., and Babaie, M.
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
College/School:College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering
Journal Name:International Proceedings of Computer Science and Information Technology
Journal Abbr.:IPCSIT
Publisher:IACSIT Press
ISSN:2010-460X
ISSN (Online):2010-460X

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