Wasige, E. and Kompa, G. (1996) A new silicon micro-test fixture facilitates the reusability of accurately characterized low power FET devices. In: 26th European Microwave Conference, Prague, Czech Republic, 1996, pp. 521-523.
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Abstract
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| Item Type: | Conference Proceedings |
|---|---|
| Status: | Published |
| Refereed: | Yes |
| Glasgow Author(s) Enlighten ID: | Wasige, Professor Edward |
| Authors: | Wasige, E., and Kompa, G. |
| College/School: | College of Science and Engineering > School of Engineering > Electronics and Nanoscale Engineering |
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