Remote soft-optical phonon scattering in Si nanowire FETs

Barker, J. R. and Martinez, A. (2014) Remote soft-optical phonon scattering in Si nanowire FETs. In: 2014 International Workshop on Computational Electronics (IWCE), Paris, France, 3-6 Jun 2014, pp. 1-3. (doi: 10.1109/IWCE.2014.6865851)

Abstract

In this work we calculate the impact of remote SO phonon scattering on the transfer characteristics of gate-all-around Si nanowire transistors. The polar SO phonons are confined to the HfO2/Si interface. Nanowire transistors with two different cross-sections are considered. The results show that the impact on the drain current is of the same order and of the same importance as other commonly used bulk-type phonons.

• Item Type: Conference Proceedings
• Status: Published
• Refereed: Yes
• Glasgow Author(s) Enlighten ID: Barker, Professor John and Martinez, Dr Antonio
• Authors: Barker, J. R., and Martinez, A.
• College/School: College of Science and Engineering > School of Engineering