A design for a pinhole scanning helium microscope

Barr, M., Fahy, A., Jardine, A., Ellis, J., Ward, D., MacLaren, D.A. , Allison, W. and Dastoor, P.C. (2014) A design for a pinhole scanning helium microscope. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 340, pp. 76-80. (doi:10.1016/j.nimb.2014.06.028)

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Publisher's URL: http://dx.doi.org/10.1016/j.nimb.2014.06.028

Abstract

We present a simplified design for a scanning helium microscope (SHeM) which utilises almost entirely off the shelf components. The SHeM produces images by detecting scattered neutral helium atoms from a surface, forming an entirely surface sensitive and non-destructive imaging technique. This particular prototype instrument avoids the complexities of existing neutral atom optics by replacing them with an aperture in the form of an ion beam milled pinhole, resulting in a resolution of around 5 microns. Using the images so far produced, an initial investigation of topological contrast has been performed.

Item Type:Articles
Status:Published
Refereed:Yes
Glasgow Author(s) Enlighten ID:MacLaren, Dr Donald
Authors: Barr, M., Fahy, A., Jardine, A., Ellis, J., Ward, D., MacLaren, D.A., Allison, W., and Dastoor, P.C.
College/School:College of Science and Engineering > School of Physics and Astronomy
Journal Name:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Publisher:Elsevier B.V.
ISSN:0168-583X
ISSN (Online):1872-9584
Copyright Holders:Copyright © 2014 Elsevier
First Published:First published in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 340:76-80
Publisher Policy:Reproduced in accordance with the copyright policy of the publisher.

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